Invention Grant
- Patent Title: Probe straightness measuring method
- Patent Title (中): 探头平直度测量方法
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Application No.: US12363887Application Date: 2009-02-02
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Publication No.: US07869970B2Publication Date: 2011-01-11
- Inventor: Kentaro Nemoto , Masaoki Yamagata
- Applicant: Kentaro Nemoto , Masaoki Yamagata
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2008-023759 20080204
- Main IPC: G01C17/38
- IPC: G01C17/38 ; G01C25/00

Abstract:
A probe straightness measuring method includes: placing a measurement jig having a measurement reference surface with a known profile error on a stage surface of an XY stage so that the measurement reference surface is slanted in a moving direction of the XY stage; measuring a displaced position of the measurement piece by a displacement detector of the probe each time the XY stage is moved for a predetermined distance while controlling a driving actuator so that the measurement piece of a probe touches the measurement reference surface at a constant pressure; and calculating a straightness error of a measurement-piece moving mechanism on a basis of a measured position of the measurement piece obtained in the measuring, a nominal position of the measurement piece obtained by a calculation and a slant angle of the measurement reference surface.
Public/Granted literature
- US20090198472A1 PROBE STRAIGHTNESS MEASURING METHOD Public/Granted day:2009-08-06
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