Invention Grant
- Patent Title: Method and apparatus for detecting multiple anomalies in a cluster of components
- Patent Title (中): 用于检测组件簇中的多个异常的方法和装置
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Application No.: US12048922Application Date: 2008-03-14
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Publication No.: US07870440B2Publication Date: 2011-01-11
- Inventor: Dan Vacar , David K. McElfresh , Kenny C. Gross , Leoncio D. Lopez
- Applicant: Dan Vacar , David K. McElfresh , Kenny C. Gross , Leoncio D. Lopez
- Applicant Address: US CA Redwood Shores
- Assignee: Oracle America, Inc.
- Current Assignee: Oracle America, Inc.
- Current Assignee Address: US CA Redwood Shores
- Agency: Park, Vaughan, Fleming & Dowler LLP
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A system that detects multiple anomalies in a cluster of components is presented. During operation, the system monitors derivatives obtained from one or more inferential variables which are received from sensors in the cluster of components. The system then determines whether one or more components within the cluster have experienced an anomalous event based on the monitored derivatives. If so, the system performs one or more remedial actions.
Public/Granted literature
- US20090234484A1 METHOD AND APPARATUS FOR DETECTING MULTIPLE ANOMALIES IN A CLUSTER OF COMPONENTS Public/Granted day:2009-09-17
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