Invention Grant
US07872485B2 System and method for use in functional failure analysis by induced stimulus 有权
用于通过诱导刺激进行功能衰竭分析的系统和方法

  • Patent Title: System and method for use in functional failure analysis by induced stimulus
  • Patent Title (中): 用于通过诱导刺激进行功能衰竭分析的系统和方法
  • Application No.: US12013881
    Application Date: 2008-01-14
  • Publication No.: US07872485B2
    Publication Date: 2011-01-18
  • Inventor: James B. Colvin
  • Applicant: James B. Colvin
  • Agency: The Danamraj Law Group, P.C.
  • Main IPC: G01R31/305
  • IPC: G01R31/305
System and method for use in functional failure analysis by induced stimulus
Abstract:
A scanning/imaging system wherein an external stimulus is used for exciting a device under test (DUT). A stimulus source is included for providing a stationary stimulus with a controllable spot size to a device under test (DUT), the controllable spot size covering a portion of the DUT for excitation by the stationary stimulus. A sensor is operable for capturing at least one of a functional response signal and an optical image signal emanating from the DUT portion. A linear positioning device is operable to facilitate scanning of remaining portions of the DUT until a predetermined area thereof has been traversed. A controller is operably coupled to the linear positioning device, stimulus source and the sensor for providing the overall control thereof.
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