Invention Grant
US07872485B2 System and method for use in functional failure analysis by induced stimulus
有权
用于通过诱导刺激进行功能衰竭分析的系统和方法
- Patent Title: System and method for use in functional failure analysis by induced stimulus
- Patent Title (中): 用于通过诱导刺激进行功能衰竭分析的系统和方法
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Application No.: US12013881Application Date: 2008-01-14
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Publication No.: US07872485B2Publication Date: 2011-01-18
- Inventor: James B. Colvin
- Applicant: James B. Colvin
- Agency: The Danamraj Law Group, P.C.
- Main IPC: G01R31/305
- IPC: G01R31/305

Abstract:
A scanning/imaging system wherein an external stimulus is used for exciting a device under test (DUT). A stimulus source is included for providing a stationary stimulus with a controllable spot size to a device under test (DUT), the controllable spot size covering a portion of the DUT for excitation by the stationary stimulus. A sensor is operable for capturing at least one of a functional response signal and an optical image signal emanating from the DUT portion. A linear positioning device is operable to facilitate scanning of remaining portions of the DUT until a predetermined area thereof has been traversed. A controller is operably coupled to the linear positioning device, stimulus source and the sensor for providing the overall control thereof.
Public/Granted literature
- US20080111566A1 System and Method for Use in Functional Failure Analysis by Induced Stimulus Public/Granted day:2008-05-15
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