Invention Grant
- Patent Title: Semiconductor apparatus and anomaly detection method of the same
- Patent Title (中): 半导体装置与异常检测方法相同
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Application No.: US12320576Application Date: 2009-01-29
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Publication No.: US07872505B2Publication Date: 2011-01-18
- Inventor: Kimiharu Eto
- Applicant: Kimiharu Eto
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Foley & Lardner LLP
- Priority: JP2008-302751 20081127
- Main IPC: H03K5/19
- IPC: H03K5/19

Abstract:
A semiconductor apparatus includes an arithmetic circuit that executes a program based on an operating clock signal input through a clock transfer node, an internal oscillator that generates an internal clock signal to be used internally, a watch dog timer that counts the internal clock signal, detect that a count value reaches a predetermined value of an execution time of the program in the arithmetic circuit and output a notification signal, and a clock monitor circuit that detects presence or absence of the operating clock signal in response to the notification signal.
Public/Granted literature
- US20100127740A1 Semiconductor apparatus and anomaly detection method of the same Public/Granted day:2010-05-27
Information query
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