Invention Grant
US07872680B2 Method and imaging apparatus for correcting defective pixel of solid-state image sensor, and method for creating pixel information
有权
用于校正固态图像传感器的缺陷像素的方法和成像装置,以及用于产生像素信息的方法
- Patent Title: Method and imaging apparatus for correcting defective pixel of solid-state image sensor, and method for creating pixel information
- Patent Title (中): 用于校正固态图像传感器的缺陷像素的方法和成像装置,以及用于产生像素信息的方法
-
Application No.: US11905273Application Date: 2007-09-28
-
Publication No.: US07872680B2Publication Date: 2011-01-18
- Inventor: Takeshi Misawa
- Applicant: Takeshi Misawa
- Applicant Address: JP Tokyo
- Assignee: Fujifilm Corporation
- Current Assignee: Fujifilm Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP.
- Priority: JP2003-009943 20030117; JP2003-091948 20030328
- Main IPC: H04N9/64
- IPC: H04N9/64 ; H04N5/225

Abstract:
In a solid-state image sensor in which a large number of pixel cells each comprised of a combination of a main photosensitive pixel having a relatively large area and a subsidiary photosensitive pixel having a relatively small area are arranged, if the subsidiary photosensitive pixel has a defect for any pixel cell, division photometry data during AE processing is read, and the defective pixel is replaced with a value obtained by dividing the output value of the main photosensitive pixel at the same position by a sensitivity ratio only for a section for which it is determined that the main photosensitive pixel is not saturated. Thus, the pixel value of a defective pixel can be accurately corrected without causing a reduction in resolution sensitivity compared to a conventional method of correcting a defective pixel using surrounding pixel information.
Public/Granted literature
Information query