Invention Grant
US07872680B2 Method and imaging apparatus for correcting defective pixel of solid-state image sensor, and method for creating pixel information 有权
用于校正固态图像传感器的缺陷像素的方法和成像装置,以及用于产生像素信息的方法

  • Patent Title: Method and imaging apparatus for correcting defective pixel of solid-state image sensor, and method for creating pixel information
  • Patent Title (中): 用于校正固态图像传感器的缺陷像素的方法和成像装置,以及用于产生像素信息的方法
  • Application No.: US11905273
    Application Date: 2007-09-28
  • Publication No.: US07872680B2
    Publication Date: 2011-01-18
  • Inventor: Takeshi Misawa
  • Applicant: Takeshi Misawa
  • Applicant Address: JP Tokyo
  • Assignee: Fujifilm Corporation
  • Current Assignee: Fujifilm Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Birch, Stewart, Kolasch & Birch, LLP.
  • Priority: JP2003-009943 20030117; JP2003-091948 20030328
  • Main IPC: H04N9/64
  • IPC: H04N9/64 H04N5/225
Method and imaging apparatus for correcting defective pixel of solid-state image sensor, and method for creating pixel information
Abstract:
In a solid-state image sensor in which a large number of pixel cells each comprised of a combination of a main photosensitive pixel having a relatively large area and a subsidiary photosensitive pixel having a relatively small area are arranged, if the subsidiary photosensitive pixel has a defect for any pixel cell, division photometry data during AE processing is read, and the defective pixel is replaced with a value obtained by dividing the output value of the main photosensitive pixel at the same position by a sensitivity ratio only for a section for which it is determined that the main photosensitive pixel is not saturated. Thus, the pixel value of a defective pixel can be accurately corrected without causing a reduction in resolution sensitivity compared to a conventional method of correcting a defective pixel using surrounding pixel information.
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