Invention Grant
- Patent Title: Real-time, 3D, non-linear microscope measuring system and method for application of the same
- Patent Title (中): 实时,3D,非线性显微镜测量系统及其应用方法
-
Application No.: US11814917Application Date: 2006-01-27
-
Publication No.: US07872748B2Publication Date: 2011-01-18
- Inventor: Szilveszter E. Vizi , Róbert Szipöcs , Balázs Rózsa , Pál Maák , Júlia Fekete , László Valenta , Gergely Katona , Péter Kalló , Károly Osvay
- Applicant: Szilveszter E. Vizi , Róbert Szipöcs , Balázs Rózsa , Pál Maák , Júlia Fekete , László Valenta , Gergely Katona , Péter Kalló , Károly Osvay
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: HU0500143 20050127
- International Application: PCT/HU2006/000009 WO 20060127
- International Announcement: WO2006/079861 WO 20060803
- Main IPC: G01N21/64
- IPC: G01N21/64

Abstract:
A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photochemically stimulate pre-selected points within a short time interval. The system further comprises a bundle of fibers composed of optical fibers or other waveguides, a rapidly working optical switch, a imaging system, a light source and an optical system. The examining optical signal is a fluorescent or other optical signal imaged on the required spot.
Public/Granted literature
- US20080308730A1 Real-Time, 3D, Non-Linear Microscope Measuring System and Method for Application of the Same Public/Granted day:2008-12-18
Information query