Invention Grant
- Patent Title: Optical measurement device
- Patent Title (中): 光学测量装置
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Application No.: US12296971Application Date: 2007-04-10
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Publication No.: US07872754B2Publication Date: 2011-01-18
- Inventor: Sipke Wadman
- Applicant: Sipke Wadman
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP06112699 20060418
- International Application: PCT/IB2007/051274 WO 20070410
- International Announcement: WO2007/119202 WO 20071025
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
An optical measurement device for measuring an optical appearance of a surface of a sample, in particular the surface of a human skin, wherein the optical measurement device comprises: a first illumination device (16) for illuminating the surface (14) with a first illumination beam (22), wherein the first illumination beam (22) is incident at a first angle of incidence (38) onto the surface (14); and a detection device (28) for detecting a response beam (22), wherein the response beam (42) is a response of the sample (12) to the first illumination beam (22), comprising at least one screen (27) for intercepting the response beam (42) and at least an image detection component (29). The optical measurement device (10) comprises a second illumination device (18), wherein the second illumination device (18) is providing a second illumination beam (24) with a second angle of incidence (54) at the surface (14), wherein the first angle of incidence (38) is different from the second angle of incidence (54).
Public/Granted literature
- US20090174878A1 OPTICAL MEASUREMENT DEVICE Public/Granted day:2009-07-09
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