Invention Grant
- Patent Title: Microscopic apparatus and observing method
- Patent Title (中): 显微镜及观察方法
-
Application No.: US11886124Application Date: 2006-09-22
-
Publication No.: US07872798B2Publication Date: 2011-01-18
- Inventor: Hisao Osawa , Yumiko Ouchi
- Applicant: Hisao Osawa , Yumiko Ouchi
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2005-296815 20051011
- International Application: PCT/JP2006/318874 WO 20060922
- International Announcement: WO2007/043313 WO 20070419
- Main IPC: G02B23/00
- IPC: G02B23/00 ; H01J3/14

Abstract:
A microscopic apparatus and an observing method can obtain information of a super-resolved image of an object under observation with a high SN ratio. Therefore, the microscopic apparatus including an illuminating optical system that illuminates a specimen plane of a sample with line-shaped illuminating light, a modulating unit that spatially modulates the illuminating light in a lengthwise direction, an image-forming optical system that forms an image of light from the specimen plane illuminated with the spatially modulated illuminating light, and a detector that detects light from the specimen plane. Accordingly, a confocal effect is obtained with respect to an unstructuring direction of an illuminated area. The essential contrast of the structured illumination of the illuminated area is enhanced by the confocal effect, and thus the modulated image of the illuminated area is detected with a high SN ratio.
Public/Granted literature
- US20080192337A1 Microscopic Apparatus and Observing Method Public/Granted day:2008-08-14
Information query