Invention Grant
- Patent Title: Memory device and memory data read method
- Patent Title (中): 内存设备和内存数据读取方式
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Application No.: US12219665Application Date: 2008-07-25
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Publication No.: US07872909B2Publication Date: 2011-01-18
- Inventor: Seung-Hwan Song , Heeseok Eun , Dong Hun Yu , Jun Jin Kong
- Applicant: Seung-Hwan Song , Heeseok Eun , Dong Hun Yu , Jun Jin Kong
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2008-0014945 20080219
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
Provided are memory devices and memory data read methods. A method device may include: a multi-bit cell array; a decision unit that may detect threshold voltages of multi-bit cells of the multi-bit cell array to decide first data from the detected threshold voltages, using a first decision value; an error detector that may detect an error bit of the first data; and a determination unit that may determine whether the decision unit decides second data from the detected threshold voltages using a second decision value, based on a number of detected error bits, the second decision value being different from the first decision value. Through this, it is possible to reduce time spent for reading data stored in the multi-bit cell.
Public/Granted literature
- US20090207659A1 Memory device and memory data read method Public/Granted day:2009-08-20
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