Invention Grant
- Patent Title: Apparatus and method for classifying defects using multiple classification modules
- Patent Title (中): 使用多个分类模块分类缺陷的装置和方法
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Application No.: US10809464Application Date: 2004-03-26
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Publication No.: US07873205B2Publication Date: 2011-01-18
- Inventor: Hirohito Okuda , Yuji Takagi , Toshifumi Honda , Atsushi Miyamoto , Takehiro Hirai
- Applicant: Hirohito Okuda , Yuji Takagi , Toshifumi Honda , Atsushi Miyamoto , Takehiro Hirai
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2003-089686 20030328
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A classification model optimum for realization of a defect classification request by a user is not known by the user. Then, the user sets a classification model which is not necessarily suitable and makes classification, resulting in degradation in classification performance. Therefore, the present invention automatically generates plural potential classification models and combines class likelihoods calculated from the plural classification models to classify. To combine, an index about the adequacy of each model, in other words, an index indicating a reliable level of likelihood calculated from the each potential classification model, is also calculated. Considering the calculated result, the class likelihoods calculated from the plural classification models are combined to execute classification.
Public/Granted literature
- US20040252878A1 Method and its apparatus for classifying defects Public/Granted day:2004-12-16
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