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US07873220B2 Algorithm to measure symmetry and positional entropy of a data set 有权
测量数据集的对称性和位置熵的算法

  • Patent Title: Algorithm to measure symmetry and positional entropy of a data set
  • Patent Title (中): 测量数据集的对称性和位置熵的算法
  • Application No.: US11715909
    Application Date: 2007-03-09
  • Publication No.: US07873220B2
    Publication Date: 2011-01-18
  • Inventor: Dennis G. Collins
  • Applicant: Dennis G. Collins
  • Agent Lydia M. DeJesus
  • Main IPC: G06K9/52
  • IPC: G06K9/52 ;  G06K9/62
Algorithm to measure symmetry and positional entropy of a data set
Abstract:
A method and algorithm for measuring the symmetry (SYM=total symmetry) of N points based on counting the number of “elementary symmetric recognition acts”, or having two distances d(A,B) and d(C,D) be equal within a given tolerance t. The same algorithm can be adapted to measure un-normalized positional entropy deficit (UPED) and positional entropy of N points. These parameters (SYM and UPED) come out almost the same for small occupation numbers (1
Abstract(Chinese):

基于对“基本对称识别动作”的数量或具有两个距离d（A，B）和d（C，D）的数量进行N点测量的对称性（SYM =总对称性）的方法和算法在 给定的公差t。 相同的算法可以适应于测量非归一化位置熵赤字（UPED）和N点的位置熵。 这些参数（SYM和UPED）对于小职业号码（1 <= k <= 4）几乎相同。 这里，占用数k是给定值d的图中相等距离的数量。 该算法可以并入诸如计算机图形程序或摄像机的成像设备中，以解决缺陷检测的问题，例如在宝石中或物体检测中。

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