Invention Grant
- Patent Title: Measurement of spoken language training, learning and testing
- Patent Title (中): 口语培训，学习和测试的测量
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Application No.: US10581753Application Date: 2005-06-24
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Publication No.: US07873522B2Publication Date: 2011-01-18
- Inventor: Robert Du , Lingfei Song , Nan N. Li , Minerva Yeung
- Applicant: Robert Du , Lingfei Song , Nan N. Li , Minerva Yeung
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- International Application: PCT/CN2005/000922 WO 20050624
- International Announcement: WO2006/136061 WO 20061228
- Main IPC: G10L15/00
- IPC: G10L15/00
Abstract:
The fluency of a spoken utterance or passage is measure and presented to the speaker and to others. In one embodiment, a method is described that includes recording a spoken utterance, evaluating the spoken utterance for accuracy, evaluating the spoken utterance for duration, and assigning a score to the spoken utterance based on the accuracy and the duration.
Public/Granted literature
- US20090204398A1 Measurement of Spoken Language Training, Learning & Testing Public/Granted day:2009-08-13
Information query
