Invention Grant
- Patent Title: Instrumentation and control information providing method, instrumentation and control information providing system, instrumentation and control information providing server, and instrumentation and control equipment
- Patent Title (中): 仪表控制信息提供方法,仪表控制信息提供系统,仪器仪表控制信息提供服务器,仪表控制设备
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Application No.: US10738988Application Date: 2003-12-19
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Publication No.: US07873692B2Publication Date: 2011-01-18
- Inventor: Takaaki Yamada , Ikuo Nanno , Kosaku Ando , Hitoshi Tanaka , Hiroyuki Togawa
- Applicant: Takaaki Yamada , Ikuo Nanno , Kosaku Ando , Hitoshi Tanaka , Hiroyuki Togawa
- Applicant Address: JP Kyoto
- Assignee: Omron Corporation
- Current Assignee: Omron Corporation
- Current Assignee Address: JP Kyoto
- Agency: Foley & Lardner LLP
- Priority: JPP2002-371063 20021220
- Main IPC: G06F15/16
- IPC: G06F15/16

Abstract:
A customer submits a service application by accessing the home page of a service provider through a personal computer 3, and transmits the data including the operation amount and the control amount of a temperature controller 4 to a server 2 of the service provider. The server 2 accumulates the received data, and in accordance with the contents of the received service application, processes the accumulated data and provides the services of calculating the control parameter for the temperature controller 4, producing a model of the object of control and making a diagnosis by checking for a temperature control fault.
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