Invention Grant
- Patent Title: Integrated systems testing
- Patent Title (中): 集成系统测试
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Application No.: US11888214Application Date: 2007-07-31
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Publication No.: US07873766B2Publication Date: 2011-01-18
- Inventor: Saeed Azimi , Son Ho
- Applicant: Saeed Azimi , Son Ho
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: G06F13/12
- IPC: G06F13/12 ; G06F13/38 ; G06F11/00 ; G01R31/28

Abstract:
A hard disk drive system comprises an interface that receives test configuration data, that transmits test result data, and that transmits and receives application data. A system on chip (SOC) includes integrated system test (IST) modules. A memory module communicates with the SOC and includes memory and an IST module. One of the IST modules communicates with the interface and is a master IST module that receives the test configuration data and that configures others of the IST modules for testing a component of the hard disk drive system.
Public/Granted literature
- US20070268036A1 Integrated systems testing Public/Granted day:2007-11-22
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