Invention Grant
- Patent Title: Scanning probe microscope and scanning method
- Patent Title (中): 扫描探针显微镜和扫描方法
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Application No.: US11961847Application Date: 2007-12-20
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Publication No.: US07874016B2Publication Date: 2011-01-18
- Inventor: Takeshi Umemoto , Norio Ookubo
- Applicant: Takeshi Umemoto , Norio Ookubo
- Applicant Address: JP Chiba-shi, Chiba
- Assignee: SII Nano Technology Inc.
- Current Assignee: SII Nano Technology Inc.
- Current Assignee Address: JP Chiba-shi, Chiba
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2006-345869 20061222
- Main IPC: G01Q10/06
- IPC: G01Q10/06 ; G01Q20/04 ; H01J37/26

Abstract:
To realize to adapt to a shape of a surface, shorten a measurement time period and promote a measurement accuracy by setting a sampling interval in accordance with a slope of the shape of the surface and controlling a stylus in accordance with the interval, there is provided a scanning probe microscope, in which in scanning the stylus, an observation data immediately therebefore is stored as a history, the sampling interval in X or Y direction is set at each time based on a shape of the observation data, and the stylus is scanned to a successive sampling position.
Public/Granted literature
- US20080156988A1 Scanning Probe Microscope and Scanning Method Public/Granted day:2008-07-03
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