Invention Grant
US07875418B2 Method for a multiple exposure, microlithography projection exposure installation and a projection system 有权
多次曝光方法,微光刻投影曝光装置和投影系统

  • Patent Title: Method for a multiple exposure, microlithography projection exposure installation and a projection system
  • Patent Title (中): 多次曝光方法,微光刻投影曝光装置和投影系统
  • Application No.: US12142138
    Application Date: 2008-06-19
  • Publication No.: US07875418B2
    Publication Date: 2011-01-25
  • Inventor: Ralf Scharnweber
  • Applicant: Ralf Scharnweber
  • Applicant Address: DE Oberkochen
  • Assignee: Carl Zeiss SMT AG
  • Current Assignee: Carl Zeiss SMT AG
  • Current Assignee Address: DE Oberkochen
  • Agency: Fish & Richardson P.C.
  • Priority: DE102004013886 20040316
  • Main IPC: G03F7/20
  • IPC: G03F7/20
Method for a multiple exposure, microlithography projection exposure installation and a projection system
Abstract:
In a method for multiply exposing at least one substrate coated with a photosensitive layer, a first exposure is carried out in accordance with a first set of exposure parameters on a first projection system, and a second exposure is carried out in accordance with a second set of exposure parameters on a second projection system spatially separated from the first projection system. The projection systems are integrated in a common projection exposure installation. The first exposure can be carried out, for example, with an amplitude mask, the second exposure with a phase mask. The use of a number of projection systems enables multiple exposure that is performed in parallel and is therefore timesaving.
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