Invention Grant
- Patent Title: Method for a multiple exposure, microlithography projection exposure installation and a projection system
- Patent Title (中): 多次曝光方法,微光刻投影曝光装置和投影系统
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Application No.: US12142138Application Date: 2008-06-19
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Publication No.: US07875418B2Publication Date: 2011-01-25
- Inventor: Ralf Scharnweber
- Applicant: Ralf Scharnweber
- Applicant Address: DE Oberkochen
- Assignee: Carl Zeiss SMT AG
- Current Assignee: Carl Zeiss SMT AG
- Current Assignee Address: DE Oberkochen
- Agency: Fish & Richardson P.C.
- Priority: DE102004013886 20040316
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
In a method for multiply exposing at least one substrate coated with a photosensitive layer, a first exposure is carried out in accordance with a first set of exposure parameters on a first projection system, and a second exposure is carried out in accordance with a second set of exposure parameters on a second projection system spatially separated from the first projection system. The projection systems are integrated in a common projection exposure installation. The first exposure can be carried out, for example, with an amplitude mask, the second exposure with a phase mask. The use of a number of projection systems enables multiple exposure that is performed in parallel and is therefore timesaving.
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