Invention Grant
- Patent Title: Microscope apparatus and microscope system
- Patent Title (中): 显微镜仪器和显微镜系统
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Application No.: US12059043Application Date: 2008-03-31
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Publication No.: US07876500B2Publication Date: 2011-01-25
- Inventor: Toshiyuki Hattori , Tatsuo Nakata , Yasunari Matsukawa , Akinori Araya , Masaharu Tomioka
- Applicant: Toshiyuki Hattori , Tatsuo Nakata , Yasunari Matsukawa , Akinori Araya , Masaharu Tomioka
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz, Goodman & Chick, PC
- Priority: JP2007-101006 20070406
- Main IPC: G02B21/00
- IPC: G02B21/00

Abstract:
It is possible to check for observation success or failure and the observation history without waiting for observation to be completely finished, thus saving time and energy required for observation, and avoiding lost opportunities for observation of precious samples etc. Provided is a microscope apparatus including an image acquisition unit for acquiring a plurality of frame images while varying a plurality of parameters; an image saving unit for successively saving the frame images acquired by the image acquisition unit; a property-information saving unit for saving property information in which identifying information of the saved frame images is associated with the parameters; and a control unit for controlling these units, wherein the control unit saves updated property information in the property-information saving unit each time the frame image is saved in the image saving unit.
Public/Granted literature
- US20080246839A1 MICROSCOPE APPARATUS AND MICROSCOPE SYSTEM Public/Granted day:2008-10-09
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