Invention Grant
- Patent Title: Recognizing apparatus and recognizing method
- Patent Title (中): 识别装置和识别方法
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Application No.: US11896900Application Date: 2007-09-06
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Publication No.: US07877334B2Publication Date: 2011-01-25
- Inventor: Takumi Kobayashi , Hiroaki Nakai
- Applicant: Takumi Kobayashi , Hiroaki Nakai
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2006-241804 20060906
- Main IPC: G06F15/18
- IPC: G06F15/18

Abstract:
A recognizing apparatus includes a training vector input unit configured to enter training vectors for training, a weak classifier generator configured to obtain weak classifiers based on the value of an element of a dimension common to the training vectors using a learning method, a classifier integrator configured to obtain non-linear mappings for each dimension of the training vectors by combining the weak classifiers, a test vector input unit configured to input a test vector to be classified, a non-linear transformer configured to a transformed vector by transforming the values of the elements of the test vector using the respective non-linear mappings, and a score calculator configured to obtain a classification score by summing the value of the respective elements of the transformed vector and recognize the test vector using the classification score.
Public/Granted literature
- US20080077543A1 Recognizing apparatus and recognizing method Public/Granted day:2008-03-27
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