Invention Grant
- Patent Title: Apparatus and method for testing computer
- Patent Title (中): 电脑测试仪器及方法
-
Application No.: US12205129Application Date: 2008-09-05
-
Publication No.: US07877638B2Publication Date: 2011-01-25
- Inventor: Li-Ping Fan , Hong-Lang Lu , Yu-Lin Liu
- Applicant: Li-Ping Fan , Hong-Lang Lu , Yu-Lin Liu
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Clifford O. Chi
- Priority: CN200810301426 20080506
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
An apparatus for testing a computer includes a control module having a power cycling test program and a display driving program therein, a switch module connected to the control module for receiving trigger signals generated from the power cycling test program and powering on or off the computer consequently, a driving module connected to the control module for receiving display driving signals from the display driving program, and a display module connected to the driving module for displaying test parameters. A method utilizing above described apparatus for testing the computer is also disclosed.
Public/Granted literature
- US20090282295A1 APPARATUS AND METHOD FOR TESTING COMPUTER Public/Granted day:2009-11-12
Information query