Methods and apparatus to track the health of integrated circuit structures are described. In an embodiment, a counter may be updated when the status of a portion of a storage unit (e.g., a cache) transitions to a defective status (e.g., as determined by reference to one or more corresponding status bits). The value stored in the counter may be compared with a threshold value, e.g., to generate a signal that is indicative of whether the threshold value has been exceeded. Other embodiments are also described.