Invention Grant
- Patent Title: Measurement of micromovements
- Patent Title (中): 微动测量
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Application No.: US12853169Application Date: 2010-08-09
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Publication No.: US07877893B2Publication Date: 2011-02-01
- Inventor: Bonifatijs Lubgins , Leonids Bekers
- Applicant: Bonifatijs Lubgins , Leonids Bekers
- Applicant Address: US NC Charlotte
- Assignee: A-Metrics, LLC
- Current Assignee: A-Metrics, LLC
- Current Assignee Address: US NC Charlotte
- Agency: Nelson Mullins Riley & Scarborough, LLP
- Priority: GB0521076.0 20051017
- Main IPC: G01B7/14
- IPC: G01B7/14

Abstract:
A micromovement measuring device has a first element such as a probe tip or flat plate coupled to a test body (107) the movement of which is to be measured. A second element (104) is located adjacent to the first element, to form a gap (108) therebetween. As the test body and the first element gradually move away from the measuring element, so increasing the size of the gap, the second element is repeatedly moved up, to restore the gap to its original size. These repeated small quantized movements of the measuring element (104) are counted, and are used to provide an indication of how far the test body (107) has moved. In other embodiments, the first element may gradually move toward the second element, with the latter repeatedly moving away.
Public/Granted literature
- US20100299949A1 MEASUREMENT OF MICROMOVEMENTS Public/Granted day:2010-12-02
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