Invention Grant
- Patent Title: Ultrasonic inspection apparatus
- Patent Title (中): 超声波检测仪
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Application No.: US12133390Application Date: 2008-06-05
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Publication No.: US07878065B2Publication Date: 2011-02-01
- Inventor: Wei Chen
- Applicant: Wei Chen
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Frank R. Niranjan
- Priority: CN200710202341.7 20071031
- Main IPC: G01N29/00
- IPC: G01N29/00

Abstract:
An ultrasonic inspection apparatus includes a container containing de-ionized water, at least one limiting member, a loading member, and a cover member. The at least one limiting member, the loading member, and the cover member are disposed in the de-ionized water and between the transmitting transducer and the receiving transducer. The limiting member is supported on the limiting member for loading the integrated circuits to be inspected. The cover member is detachably disposed on the loading member for holding the integrated circuits by a gravitational force of the cover member acting on the loading member.
Public/Granted literature
- US20090107242A1 ULTRASONIC INSPECTION APPARATUS Public/Granted day:2009-04-30
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