Invention Grant
- Patent Title: Apparatus and methods of detecting features on a microarray
- Patent Title (中): 检测微阵列特征的装置和方法
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Application No.: US10422163Application Date: 2003-04-24
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Publication No.: US07879541B2Publication Date: 2011-02-01
- Inventor: Robert H. Kincaid
- Applicant: Robert H. Kincaid
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; G01N35/00 ; G01N21/00

Abstract:
A method of making a microarray apparatus with enhanced feature detectability provides for accurate detection of each feature location, regardless of the quality or quantity of signals from hybridized oligomer test probes. The method comprises separately providing a control probe or stilt and an oligomer test probe at each feature location on the microarray, such that each feature comprises a control probe and a test probe. The control probe comprises a sequence of nucleic acids unique to the control probe. The control probe is labeled with a label that emits a control signal. The oligomer test probe is labeled with a test label that emits a test signal distinguishable from the control signal. When the microarray is hybridized and interrogated, the control signal indicates the location of each and every feature on the array and the test signal indicates the location of hybridized oligomer test probes.
Public/Granted literature
- US20030186310A1 Apparatus and methods of detecting features on a microarray Public/Granted day:2003-10-02
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