Invention Grant
- Patent Title: Method of manufacturing a semiconductor device including a semiconductor substrate with stripes of different crystal plane directions
- Patent Title (中): 制造包括具有不同晶面方向的条纹的半导体衬底的半导体器件的方法
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Application No.: US12273010Application Date: 2008-11-18
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Publication No.: US07879689B2Publication Date: 2011-02-01
- Inventor: Tomoaki Moriwaka
- Applicant: Tomoaki Moriwaka
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2007-298799 20071119
- Main IPC: H01L21/301
- IPC: H01L21/301 ; H01L21/461 ; H01L21/84 ; H01L27/12

Abstract:
Manufacturing a semiconductor device with higher operating characteristics and achieve low power consumption of a semiconductor integrated circuit. A single crystal semiconductor layer is formed so that crystal plane directions of single crystal semiconductor layers which are used for channel regions of an n-channel TFT and a p-channel TFT and which are formed over the same plane of the substrate are the most appropriate crystal plane directions for each TFT. In accordance with such a structure, mobility of carrier flowing through a channel is increased and the semiconductor device with higher operating characteristics can be provided. Low voltage driving can be performed, and low power consumption can be achieved.
Public/Granted literature
- US20090127591A1 SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF Public/Granted day:2009-05-21
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