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US07879692B2 Programmable resistive memory cell with self-forming gap 有权
具有自形成间隙的可编程电阻存储单元

Programmable resistive memory cell with self-forming gap
Abstract:
A memory device has a first electrode, a second electrode, and memory material defining an inter-electrode current path between the first electrode and the second electrode. A gap is formed by shrinkage of the shrinkable material between the memory material and a shrinkable material next to the memory material.
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