Invention Grant
- Patent Title: Programmable resistive memory cell with self-forming gap
- Patent Title (中): 具有自形成间隙的可编程电阻存储单元
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Application No.: US12576099Application Date: 2009-10-08
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Publication No.: US07879692B2Publication Date: 2011-02-01
- Inventor: Hsiang-Lan Lung
- Applicant: Hsiang-Lan Lung
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes Beffel & Wolfeld LLP
- Main IPC: H01L21/326
- IPC: H01L21/326

Abstract:
A memory device has a first electrode, a second electrode, and memory material defining an inter-electrode current path between the first electrode and the second electrode. A gap is formed by shrinkage of the shrinkable material between the memory material and a shrinkable material next to the memory material.
Public/Granted literature
- US20100029062A1 PROGRAMMABLE RESISTIVE MEMORY CELL WITH SELF-FORMING GAP Public/Granted day:2010-02-04
Information query
IPC分类: