Invention Grant
- Patent Title: Semiconductor device manufacturing method
- Patent Title (中): 半导体器件制造方法
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Application No.: US12320241Application Date: 2009-01-22
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Publication No.: US07879714B2Publication Date: 2011-02-01
- Inventor: Kiyonori Watanabe
- Applicant: Kiyonori Watanabe
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Rabin & Berdo, PC
- Priority: JP2008-042207 20080222
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
There is provide a semiconductor device manufacturing method, including: preparing a substrate; laminating an insulation layer on the substrate; laminating a first underlying metal layer on the insulation layer; forming rewiring on the first underlying metal layer; removing exposed portions of the first underlying metal layer; laminating a second underlying metal layer on the rewiring and the insulation layer; forming a column electrode on the rewiring via the second underlying metal layer; and removing exposed portions of the second underlying metal layer.
Public/Granted literature
- US20090215258A1 Semiconductor device manufacturing method Public/Granted day:2009-08-27
Information query
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