Invention Grant
- Patent Title: Memory using tunneling field effect transistors
- Patent Title (中): 存储器采用隧道场效应晶体管
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Application No.: US11438450Application Date: 2006-05-22
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Publication No.: US07880160B2Publication Date: 2011-02-01
- Inventor: Thomas Nirschl
- Applicant: Thomas Nirschl
- Applicant Address: DE Munich
- Assignee: Qimonda AG
- Current Assignee: Qimonda AG
- Current Assignee Address: DE Munich
- Agency: Dicke, Bilig & Czaja, PLLC
- Main IPC: H01L29/04
- IPC: H01L29/04

Abstract:
A memory includes a first tunneling field effect transistor including a first drain and a first source, the first drain coupled to a first resistive memory element. The memory includes a second tunneling field effect transistor including a second drain and sharing the first source, the second drain coupled to a second resistive memory element. The memory includes a first region coupled to the first source for providing a source node.
Public/Granted literature
- US20070267619A1 Memory using tunneling field effect transistors Public/Granted day:2007-11-22
Information query
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