Invention Grant
- Patent Title: Trench semiconductor device of improved voltage strength
- Patent Title (中): 沟槽半导体器件具有提高的电压强度
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Application No.: US12364353Application Date: 2009-02-02
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Publication No.: US07880227B2Publication Date: 2011-02-01
- Inventor: Tetsuya Takahashi
- Applicant: Tetsuya Takahashi
- Applicant Address: JP
- Assignee: Sanken Electric Co., Ltd.
- Current Assignee: Sanken Electric Co., Ltd.
- Current Assignee Address: JP
- Agency: Woodcock Washburn LLP
- Priority: JP2005-245533 20050826
- Main IPC: H01L29/94
- IPC: H01L29/94

Abstract:
A trench IGBT is disclosed which includes a semiconductor substrate having formed therein a set of cell trenches formed centrally and a set of annular guard trenches concentrically surrounding the cell trenches. The cell trenches receive cell trench conductors via cell trench insulators for providing IGBT cells. The guard trenches receive guard trench conductors via guard trench insulators for enabling the IGBT to withstand higher voltages through mitigation of field concentrations. Capacitive coupling conductors overlie the guard trench conductors via a dielectric layer, each for capacitively coupling together two neighboring ones of the guard trench conductors. The capacitive coupling conductors are easily adjustably variable in shape, size and placement relative to the guard trench conductors for causing the individual guard trench conductors to possess potentials for an optimal contour of the depletion layer.
Public/Granted literature
- US20090173995A1 TRENCH SEMICONDUCTOR DEVICE OF IMPROVED VOLTAGE STRENGTH, AND METHOD OF FABRICATION Public/Granted day:2009-07-09
Information query
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