Invention Grant
- Patent Title: Wafer level CSP sensor
- Patent Title (中): 晶圆级CSP传感器
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Application No.: US12423071Application Date: 2009-04-14
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Publication No.: US07880244B2Publication Date: 2011-02-01
- Inventor: Oliver Kierse
- Applicant: Oliver Kierse
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Sunstein Kann Murphy & Timbers LLP
- Main IPC: H01L27/14
- IPC: H01L27/14

Abstract:
An electronics package has a wafer level chip scale package (WLCSP) die substrate containing electronic circuits. Through-silicon vias through the die substrate electrically connect the electronic circuits to the bottom surface of the die substrate. A package sensor is coupled to the die substrate for sensing an environmental parameter. A protective encapsulant layer covers the top surface of the die substrate. A sensor aperture over the package sensor provides access for the package sensor to the environmental parameter.
Public/Granted literature
- US20090256216A1 Wafer Level CSP Sensor Public/Granted day:2009-10-15
Information query
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