Invention Grant
US07880485B2 High-sensitive resistance measuring device and monitoring method of solder bump
失效
高灵敏度电阻测量装置和焊料凸块的监测方法
- Patent Title: High-sensitive resistance measuring device and monitoring method of solder bump
- Patent Title (中): 高灵敏度电阻测量装置和焊料凸块的监测方法
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Application No.: US12116399Application Date: 2008-05-07
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Publication No.: US07880485B2Publication Date: 2011-02-01
- Inventor: Naoaki Nakamura
- Applicant: Naoaki Nakamura
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2007-219993 20070827
- Main IPC: G01R27/08
- IPC: G01R27/08

Abstract:
According to an aspect of an embodiment, a high-sensitive resistance measuring device of solder bumps comprises a resistance variation detection unit which detects a differential voltage (ΔV=V1−V2), which is obtained by subtracting a second voltage (V2) generated in a reference bump connection unit by a constant current (I) from a second constant current source from a first voltage (V1) generated in a monitored bump connection unit by the constant current I from a first constant current source, as a resistance variation voltage representing a resistance variation (ΔR) of the monitored bump connection unit.
Public/Granted literature
- US20090058435A1 HIGH-SENSITIVE RESISTANCE MEASURING DEVICE AND MONITORING METHOD OF SOLDER BUMP Public/Granted day:2009-03-05
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