Invention Grant
- Patent Title: Method and apparatus for measuring and compensating for static phase error in phase locked loops
- Patent Title (中): 用于测量和补偿锁相环静态相位误差的方法和装置
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Application No.: US12543284Application Date: 2009-08-18
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Publication No.: US07880518B2Publication Date: 2011-02-01
- Inventor: Keith Aelwyn Jenkins
- Applicant: Keith Aelwyn Jenkins
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Anne V. Dougherty, Esq.
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
A method and circuit for static phase error measurement includes a reference clock delay chain having a selectable number of delay elements. A number of the delay elements are enabled in accordance with a select length signal to delay a reference clock signal. A feedback signal delay chain also has a selectable number of delay elements. A number of the delay elements are enabled in accordance with a select length signal to delay a feedback signal. A latch tests phase alignment between the delayed reference clock signal and the delayed feedback signal and outputs a measurement of static phase error.
Public/Granted literature
- US20090295433A1 METHOD AND APPARATUS FOR MEASURING AND COMPENSATING FOR STATIC PHASE ERROR IN PHASE LOCKED LOOPS Public/Granted day:2009-12-03
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