Invention Grant
- Patent Title: Sample and hold circuit and digital-to-analog converter circuit
- Patent Title (中): 采样保持电路和数模转换电路
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Application No.: US12458594Application Date: 2009-07-16
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Publication No.: US07880651B2Publication Date: 2011-02-01
- Inventor: Hiroshi Tsuchi
- Applicant: Hiroshi Tsuchi
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2008-186258 20080717
- Main IPC: H03M1/00
- IPC: H03M1/00

Abstract:
Disclosed is a sample and hold circuit including a differential circuit, an amplifier stage and a sampling voltage supply circuit. The differential circuit includes first and second capacitance elements, electric charge of which is distributed by a first switch, a first MOS transistor having a gate connected via a second switch to one end of the first capacitance element and also connected via a third switch to an output terminal, and having a source connected to a first current source, a second MOS transistor having a gate connected to one end of the second capacitance element and having a source connected to a second current source and also connected via a forth switch to the source of the first MOS transistor, and a load circuit connected between the drains of the first and second MOS transistors and a terminal of a second power supply. The amplifier stage receives an output of the differential circuit and has an output connected to the output terminal. The sampling voltage supply circuit delivers a sampling voltage to the one end of at least one of the first and second capacitance elements.
Public/Granted literature
- US20100013686A1 Sample and hold circuit and digital-to-analog converter circuit Public/Granted day:2010-01-21
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