Invention Grant
- Patent Title: Voltage reference generation for resistive sense memory cells
- Patent Title (中): 电阻读出单元的电压参考生成
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Application No.: US12269598Application Date: 2008-11-12
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Publication No.: US07881094B2Publication Date: 2011-02-01
- Inventor: Yiran Chen , Hai Li , Harry Hongyue Liu , KangYong Kim , Henry F. Huang
- Applicant: Yiran Chen , Hai Li , Harry Hongyue Liu , KangYong Kim , Henry F. Huang
- Applicant Address: US CA Scotts Valley
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Scotts Valley
- Agency: Fellers, Snider, et al.
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
Various embodiments of the present invention are generally directed to an apparatus and associated method for generating a reference voltage for a resistive sense memory (RSM) cell, such as an STRAM cell. A dummy reference cell used to generate a reference voltage to sense a resistive state of an adjacent RSM cell. The dummy reference cell comprises a switching device, a resistive sense element (RSE) programmed to a selected resistive state, and a dummy resistor coupled to the RSE. A magnitude of the reference voltage is set in relation to the selected resistive state of the RSE and the resistance of the dummy resistor.
Public/Granted literature
- US20100118588A1 VOLTAGE REFERENCE GENERATION FOR RESISTIVE SENSE MEMORY CELLS Public/Granted day:2010-05-13
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