Invention Grant
- Patent Title: Semiconductor memory device and operation method thereof
- Patent Title (中): 半导体存储器件及其操作方法
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Application No.: US12346819Application Date: 2008-12-30
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Publication No.: US07881132B2Publication Date: 2011-02-01
- Inventor: Beom-Ju Shin
- Applicant: Beom-Ju Shin
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2008-0067196 20080710
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A semiconductor memory device includes a delay locked loop to generate a delay control signal corresponding to a detected phase difference between reference and feedback clock signals, a delay locked loop (DLL) clock signal, and the feedback clock signal. The memory device further includes a delay time measurement device to measure a first degree of delay between the reference and feedback clock signals and output a delay measurement value, and an output enable signal generation device to delay read command information synchronized with an external clock signal by a second degree of delay between the reference and DLL clock signals. The output enable signal generation device generates the read command information as final output enable signal by synchronizing the read command information with the DLL clock signal according to the delay measurement value and column address strobe (CAS) latency information.
Public/Granted literature
- US20100008167A1 SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD THEREOF Public/Granted day:2010-01-14
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