Invention Grant
- Patent Title: Reference data optimization learning method and pattern recognition system
- Patent Title (中): 参考数据优化学习方法和模式识别系统
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Application No.: US11508901Application Date: 2006-08-24
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Publication No.: US07881525B2Publication Date: 2011-02-01
- Inventor: Hans Jurgen Mattausch , Tetsushi Koide , Yoshinori Shirakawa
- Applicant: Hans Jurgen Mattausch , Tetsushi Koide , Yoshinori Shirakawa
- Applicant Address: JP Higashihiroshima-shi
- Assignee: Hiroshima University
- Current Assignee: Hiroshima University
- Current Assignee Address: JP Higashihiroshima-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2004-053433 20040227
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
The present invention is directed to a pattern recognition system in which new reference data to be added is efficiently learned. In the pattern recognition system, there is performed the calculation of distances equivalent to similarities between input data of a pattern search target and a plurality of reference data, and based on input data of a fixed number of times corresponding to the reference data set as a recognized winner, a gravity center thereof is calculated to optimize the reference data. Furthermore, a threshold value is changed to enlarge/reduce recognition areas, whereby erroneous recognition is prevented and a recognition rate is improved.
Public/Granted literature
- US20070003135A1 Reference data optimization learning method and pattern recognition system Public/Granted day:2007-01-04
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