Invention Grant
- Patent Title: Measuring structure for magneto encephalographic equipment with a superconducting magnetic-shield
- Patent Title (中): 具有超导磁屏蔽的磁脑设备测量结构
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Application No.: US11765741Application Date: 2007-06-20
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Publication No.: US07881760B2Publication Date: 2011-02-01
- Inventor: Toshiaki Matsui , Hiroshi Ohta
- Applicant: Toshiaki Matsui , Hiroshi Ohta
- Applicant Address: JP Tokyo
- Assignee: National Institute of Information and Communications Technology
- Current Assignee: National Institute of Information and Communications Technology
- Current Assignee Address: JP Tokyo
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP.
- Main IPC: G01R33/035
- IPC: G01R33/035 ; A61B5/05

Abstract:
A magneto-encephalographic equipment superconducting magnetic-shield comprising a vacuum-tight body comprising an outer enclosure wall, a first inner enclosure wall inserted in the outer enclosure wall to define a upper closed space, and a second inner enclosure wall to define a lower open space. The first and second inner enclosure walls are arranged with the bottom of the first inner enclosure wall facing the ceiling of the second inner enclosure wall. A first enclosure of HTSC and a second enclosure of high-permeability material are concentrically arranged in the annular vacuum space defined between the first and second inner enclosure walls and the outer enclosure wall. A head-accommodating area is delimited by the hollow partition between, the bottom of the first inner enclosure wall and the ceiling of the second inner enclosure wall both facing each other, and a plurality of SQUID sensors are arranged in the upper closed space, encircling the head-accommodating area.
Public/Granted literature
- US20080108504A1 MEASURING STRUCTURE FOR MAGNETO ENCEPHALOGRAPHIC EQUIPMENT WITH A SUPERCONDUCTING MAGNETIC-SHIELD Public/Granted day:2008-05-08
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