Invention Grant
- Patent Title: Diagnostic apparatus and method
- Patent Title (中): 诊断仪和方法
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Application No.: US10599529Application Date: 2004-04-23
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Publication No.: US07881837B2Publication Date: 2011-02-01
- Inventor: Masanori Misawa , Shinya Ishigaki
- Applicant: Masanori Misawa , Shinya Ishigaki
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Development Company, L.P.
- Current Assignee: Hewlett Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- International Application: PCT/JP2004/005931 WO 20040423
- International Announcement: WO2005/103630 WO 20051103
- Main IPC: G01D21/00
- IPC: G01D21/00 ; G01M15/00

Abstract:
Provided is a diagnostic apparatus easily applied to diagnosis of a small lot product, etc. When measurement data on a measurement object is inputted sequentially, a filter section (408) performs filtering of the measurement data. When new measurement data is employed as diagnosis object data, a statistic processing section (420) updates diagnosis reference data using the new diagnosis object data. A diagnostic section (416) diagnoses the diagnosis object data based on the diagnosis reference data and determines whether an abnormality is present or not. If an abnormality is present, the fact is displayed to a user along with diagnosis results through an UI section (428).
Public/Granted literature
- US20070276559A1 Diagnostic apparatus and method Public/Granted day:2007-11-29
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