Invention Grant
- Patent Title: Method for correcting biparametric spectra
- Patent Title (中): 校正二参数谱的方法
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Application No.: US11587645Application Date: 2005-04-21
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Publication No.: US07881893B2Publication Date: 2011-02-01
- Inventor: Guillaume Montemont
- Applicant: Guillaume Montemont
- Applicant Address: FR Paris FR Villacoublay
- Assignee: Commissariat a l'Energie Atomique,Compagnie Generale des Matieres Nucleaires
- Current Assignee: Commissariat a l'Energie Atomique,Compagnie Generale des Matieres Nucleaires
- Current Assignee Address: FR Paris FR Villacoublay
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR0404763 20040503
- International Application: PCT/FR2005/050270 WO 20050421
- International Announcement: WO2005/114257 WO 20051201
- Main IPC: G01D5/34
- IPC: G01D5/34
Abstract:
A method for processing a two-parameter spectrum including selecting a profile parameter for the spectrum and an initial correction function, for any profile selected according to this parameter, carrying out at least a correction operation by multiplying this selected profile by a correction function, equal to the sum of at least a portion of the already corrected profiles.
Public/Granted literature
- US20080061224A1 Method for Correcting Biparametric Spectra Public/Granted day:2008-03-13
Information query
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