Invention Grant
- Patent Title: Process and methodology for generic analysis of metrics related to resource utilization and performance
- Patent Title (中): 与资源利用和绩效相关的指标的通用分析的过程和方法
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Application No.: US11766544Application Date: 2007-06-21
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Publication No.: US07882216B2Publication Date: 2011-02-01
- Inventor: John Richard Houlihan , Dilton Monroe McGowan, II
- Applicant: John Richard Houlihan , Dilton Monroe McGowan, II
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Yee & Associates, P.C.
- Agent Justin M. Dillon
- Main IPC: G06F15/16
- IPC: G06F15/16 ; G06F15/173 ; G06F9/46

Abstract:
A generic algorithm for analysis of resource metrics. A threshold is calculated in a stack tier policy for the performance state of a metric in a virtualized process collection (VPC). Responsive to determining that the metric is a critical metric, a weighted average of all metrics in the VPC is determined. Responsive to determining that the weighted average exceeds the threshold in the stack tier policy, if the value of the metric is determined to be higher than values for all recorded metrics, the value of the metric is stored as a highest value. A weighted average performance state of all metrics is calculated as the weight property of the performance metric divided by the weight factor total. Responsive to determining that the highest value is higher than the weighted average performance state of all metrics, the highest value is used as the performance state of the VPC.
Public/Granted literature
- US20080320123A1 PROCESS AND METHODOLOGY FOR GENERIC ANALYSIS OF METRICS RELATED TO RESOURCE UTILIZATION AND PERFORMANCE Public/Granted day:2008-12-25
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