Invention Grant
- Patent Title: Built in test controller with a downloadable testing program
- Patent Title (中): 内置测试控制器，具有可下载的测试程序
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Application No.: US12118477Application Date: 2008-05-09
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Publication No.: US07882406B2Publication Date: 2011-02-01
- Inventor: Alexander E. Andreev , Anatoli A. Bolotov
- Applicant: Alexander E. Andreev , Anatoli A. Bolotov
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agent Christopher P. Maiorana, PC
- Main IPC: G11C29/00
- IPC: G11C29/00
Abstract:
An apparatus comprising a processor and an internal memory. The processor may be configured to test an external memory using (i) a netlist and (ii) a testing program. The internal memory may be configured to store the testing program. The testing program may be downloadable to the internal memory independently from the storing of the netlist.
Public/Granted literature
- US20090282303A1 BUILT IN TEST CONTROLLER WITH A DOWNLOADABLE TESTING PROGRAM Public/Granted day:2009-11-12
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