Invention Grant
US07882468B2 Integrated circuit device evaluation device, evaluation method, and evaluation program 有权
集成电路设备评估装置,评价方法和评价程序

  • Patent Title: Integrated circuit device evaluation device, evaluation method, and evaluation program
  • Patent Title (中): 集成电路设备评估装置,评价方法和评价程序
  • Application No.: US11910779
    Application Date: 2006-04-07
  • Publication No.: US07882468B2
    Publication Date: 2011-02-01
  • Inventor: Takashi HaradaHiroshi Wabuka
  • Applicant: Takashi HaradaHiroshi Wabuka
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2005-111448 20050407
  • International Application: PCT/JP2006/307502 WO 20060407
  • International Announcement: WO2006/109750 WO 20061019
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Integrated circuit device evaluation device, evaluation method, and evaluation program
Abstract:
Time-axis data that include the peak waveform and the clock frequency of the power supply current when the LSI is switched are inputted to the LSI information input unit, and the LSI equivalent circuit creation unit creates an equivalent circuit of the LSI on the basis of the time-axis data. The time-axis/frequency-axis conversion unit converts the time-axis data to frequency-axis data. The equivalent circuit synthesis unit synthesizes the equivalent circuits of the printed wiring substrate, the power supply regulator, and the LSI to create a single equivalent circuit; the frequency-axis circuit analysis unit performs frequency-axis analysis of the single equivalent circuit; and the frequency-axis/time-axis conversion unit converts the results to time-axis data. The amount of fluctuation of the power supply voltage of an integrated circuit device can thereby be evaluated in a short time.
Information query
Patent Agency Ranking
0/0