Invention Grant
- Patent Title: Alignment adjusting mechanism and measuring instrument
- Patent Title (中): 对准调整机构和测量仪器
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Application No.: US12787903Application Date: 2010-05-26
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Publication No.: US07882644B2Publication Date: 2011-02-08
- Inventor: Takeshi Kawabata , Takeshi Yamamoto
- Applicant: Takeshi Kawabata , Takeshi Yamamoto
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Rankin, Hill & Clark LLP
- Priority: JP2009-126237 20090526; JP2010-062239 20100318
- Main IPC: G01B3/00
- IPC: G01B3/00 ; G01B7/03

Abstract:
An alignment mechanism includes: an adjusting plate having first and second adjustment ends parallel to an X axis direction; a probe fixing portion provided to the adjusting plate; a probe fixed to the probe fixing portion; a reinforcing plate having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws for pressing the adjusting plate in the Y axis direction; and adjustment connectors for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus of the probe is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.
Public/Granted literature
- US20100299946A1 ALIGNMENT ADJUSTING MECHANISM AND MEASURING INSTRUMENT Public/Granted day:2010-12-02
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