Invention Grant
- Patent Title: Smart card and method of testing smart card
- Patent Title (中): 智能卡和智能卡测试方法
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Application No.: US11763856Application Date: 2007-06-15
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Publication No.: US07883020B2Publication Date: 2011-02-08
- Inventor: Seung-Won Lee
- Applicant: Seung-Won Lee
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2006-0101427 20061018
- Main IPC: G06K19/06
- IPC: G06K19/06
Abstract:
A smart card includes a non-volatile memory, a CPU, and a plurality of pads. The non-volatile memory stores a test program. The CPU is released from a reset state in response to a test enable signal. The CPU executes the test program stored in the non-volatile memory based on predetermined flag information and stores a result of the test program in the non-volatile memory.
Public/Granted literature
- US20080093465A1 SMART CARD AND METHOD OF TESTING SMART CARD Public/Granted day:2008-04-24
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