Invention Grant
- Patent Title: Droplet information measuring method and apparatus therefor, film pattern forming method, device manufacturing method, droplet discharge apparatus, electro-optical apparatus, and electronic apparatus
- Patent Title (中): 液滴信息测量方法及其装置，薄膜图案形成方法，装置制造方法，液滴喷射装置，电光装置和电子装置
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Application No.: US11490063Application Date: 2006-07-21
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Publication No.: US07883165B2Publication Date: 2011-02-08
- Inventor: Takashi Masuda
- Applicant: Takashi Masuda
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2003-195826 20030711; JP2003-195827 20030711; JP2003-195829 20030711
- Main IPC: B41J2/05
- IPC: B41J2/05
Abstract:
A droplet information measuring method includes a preparation step of preparing a discharge head for discharging droplets, a measurement step of depositing a plurality of the droplets in series at predetermined intervals, and measuring a drying times of the plurality of droplets, and a calculation step of repeating the measurement step while varying the intervals of the plurality of droplets, and calculating a vapor diffusion distance of the droplets based upon the measurement results.
Public/Granted literature
Information query
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