Invention Grant
- Patent Title: System and method for removing particles from a polishing pad
- Patent Title (中): 用于从抛光垫去除颗粒的系统和方法
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Application No.: US12093113Application Date: 2005-11-08
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Publication No.: US07883393B2Publication Date: 2011-02-08
- Inventor: Srdjan Kordic , Sebastien Petitdidier , Janos Farkas , Silvio Del Monaco
- Applicant: Srdjan Kordic , Sebastien Petitdidier , Janos Farkas , Silvio Del Monaco
- Applicant Address: US TX Austin IT Agrate Brianza FR Crolles
- Assignee: Freescale Semiconductor, Inc.,ST Microelectronics SRL,ST Microelectronics Crolles SAS
- Current Assignee: Freescale Semiconductor, Inc.,ST Microelectronics SRL,ST Microelectronics Crolles SAS
- Current Assignee Address: US TX Austin IT Agrate Brianza FR Crolles
- International Application: PCT/EP2005/013528 WO 20051108
- International Announcement: WO2007/054125 WO 20070518
- Main IPC: B24B49/00
- IPC: B24B49/00

Abstract:
A system for removing particles from a polishing pad to improve the efficiency of the removal of material by the polishing pad as part of a chemical-mechanical polishing process, the system comprising a polishing pad; a fluid dispenser arranged to dispense a fluid on the polishing pad; and removal means, wherein the removal means include a heater for increasing the temperature of the fluid dispensed on the polishing pad, and/or voltage means for coupling the polishing pad to a voltage source for repelling charged particles from the polishing pad surface while the fluid dispenser is dispensing the fluid on the polishing pad.
Public/Granted literature
- US20080287041A1 System and Method for Removing Particles From a Polishing Pad Public/Granted day:2008-11-20
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