Invention Grant
- Patent Title: Substrate processing apparatus and method of manufacturing semiconductor device
- Patent Title (中): 基板处理装置及半导体装置的制造方法
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Application No.: US12421117Application Date: 2009-04-09
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Publication No.: US07883581B2Publication Date: 2011-02-08
- Inventor: Naoharu Nakaiso , Kiyohiko Maeda , Masayuki Yamada
- Applicant: Naoharu Nakaiso , Kiyohiko Maeda , Masayuki Yamada
- Applicant Address: JP Tokyo
- Assignee: Hitachi Kokusai Electric, Inc.
- Current Assignee: Hitachi Kokusai Electric, Inc.
- Current Assignee Address: JP Tokyo
- Priority: JP2008-104559 20080414
- Main IPC: C23C16/52
- IPC: C23C16/52 ; C23C16/56 ; C23F1/00 ; H01L21/306 ; C23C16/06 ; C23C16/22

Abstract:
Provided are a substrate processing apparatus and a method of manufacturing a semiconductor device. The substrate processing apparatus includes a reaction vessel configured to process a substrate, a heater configured to heat an inside of the reaction vessel, a gas supply line configured to supply gas into the reaction vessel, a first valve installed at the gas supply line, a flow rate controller installed at the gas supply line, a main exhaust line configured to exhaust the inside of the reaction vessel, a second valve installed at the main exhaust line, a slow exhaust line installed at the main exhaust line, a third valve installed at the slow exhaust line, a throttle part installed at the slow exhaust line, a vacuum pump installed at the main exhaust line, and a controller configured to control the valves and the flow rate controller.
Public/Granted literature
- US20090258504A1 SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2009-10-15
Information query
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