- Patent Title: Method and apparatus for measuring pH of low alkalinity solutions
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Application No.: US11800746Application Date: 2007-05-07
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Publication No.: US07883898B2Publication Date: 2011-02-08
- Inventor: Bingzhi Chen , Weiyi Cui , Li Zhang , Caibin Xiao
- Applicant: Bingzhi Chen , Weiyi Cui , Li Zhang , Caibin Xiao
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Wegman, Hessler & Vanderburg
- Main IPC: G01N31/16
- IPC: G01N31/16 ; G01N21/00

Abstract:
Systems and methods are described for measuring pH of low alkalinity samples. The present invention provides a sensor array comprising a plurality of pH indicators, each indicator having a different indicator concentration. A calibration function is generated by applying the sensor array to a sample solution having a known pH such that pH responses from each indicator are simultaneously recorded versus indicator concentration for each indicator. Once calibrated, the sensor array is applied to low alkalinity samples having unknown pH. Results from each pH indicator are then compared to the calibration function, and fitting functions are extrapolated to obtain the actual pH of the low alkalinity sample.
Public/Granted literature
- US20080280373A1 Method and apparatus for measuring pH of low alkalinity solutions Public/Granted day:2008-11-13
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