Invention Grant
US07884022B2 Multiple deposition for integration of spacers in pitch multiplication process
有权
用于在间距乘法过程中整合间隔物的多次沉积
- Patent Title: Multiple deposition for integration of spacers in pitch multiplication process
- Patent Title (中): 用于在间距乘法过程中整合间隔物的多次沉积
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Application No.: US11625165Application Date: 2007-01-19
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Publication No.: US07884022B2Publication Date: 2011-02-08
- Inventor: Jingyi Bai , Gurtej S Sandhu , Shuang Meng
- Applicant: Jingyi Bai , Gurtej S Sandhu , Shuang Meng
- Applicant Address: US NY Mt. Kisco
- Assignee: Round Rock Research, LLC
- Current Assignee: Round Rock Research, LLC
- Current Assignee Address: US NY Mt. Kisco
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Main IPC: H01L21/033
- IPC: H01L21/033

Abstract:
Pitch multiplication is performed using a two step process to deposit spacer material on mandrels. The precursors of the first step react minimally with the mandrels, forming a barrier layer against chemical reactions for the deposition process of the second step, which uses precursors more reactive with the mandrels. Where the mandrels are formed of amorphous carbon and the spacer material is silicon oxide, the silicon oxide is first deposited by a plasma enhanced deposition process and then by a thermal chemical vapor deposition process. Oxygen gas and plasma-enhanced tetraethylorthosilicate (TEOS) are used as reactants in the plasma enhanced process, while ozone and TEOS are used as reactants in the thermal chemical vapor deposition process. The oxygen gas is less reactive with the amorphous carbon than ozone, thereby minimizing deformation of the mandrels caused by oxidation of the amorphous carbon.
Public/Granted literature
- US20070117310A1 MULTIPLE DEPOSITION FOR INTEGRATION OF SPACERS IN PITCH MULTIPLICATION PROCESS Public/Granted day:2007-05-24
Information query
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