Invention Grant
- Patent Title: ESD detection circuit and related method thereof
- Patent Title (中): ESD检测电路及其相关方法
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Application No.: US12334496Application Date: 2008-12-14
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Publication No.: US07884617B2Publication Date: 2011-02-08
- Inventor: Ming-Dou Ker , Po-Yen Chiu , Chun Huang
- Applicant: Ming-Dou Ker , Po-Yen Chiu , Chun Huang
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: Faraday Technology Corp.
- Current Assignee: Faraday Technology Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H01H31/02
- IPC: H01H31/02

Abstract:
An electro-static discharge (ESD) detection circuit is provided. The ESD detection circuit includes: a first power pad for receiving a first supply voltage; a second power pad for receiving a second supply voltage; an RC circuit having an impedance component coupled between the first power pad and a first terminal and having an capacitive component coupled between the first terminal and a second terminal, wherein the second terminal is not directly connected to the second supply voltage; a trigger circuit couples to the first power pad, the second power pad, and the RC circuit, for generating an ESD trigger signal according to a voltage level at the first terminal and a voltage level at the second terminal, and a bias circuit coupled between the first power pad and the second power pad for providing a bias voltage to the second terminal.
Public/Granted literature
- US20100148797A1 ESD DETECTION CIRCUIT AND RELATED METHOD THEREOF Public/Granted day:2010-06-17
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