Invention Grant
- Patent Title: Single event transient mitigation and measurement in integrated circuits
- Patent Title (中): 集成电路中的单事件瞬态缓解和测量
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Application No.: US12828821Application Date: 2010-07-01
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Publication No.: US07884636B2Publication Date: 2011-02-08
- Inventor: Sana Rezgui , John McCollum , Jih-Jong Wang
- Applicant: Sana Rezgui , John McCollum , Jih-Jong Wang
- Applicant Address: US CA Mountain View
- Assignee: Actel Corporation
- Current Assignee: Actel Corporation
- Current Assignee Address: US CA Mountain View
- Agency: Lewis and Roca LLP
- Main IPC: H03K17/16
- IPC: H03K17/16

Abstract:
A method for single event transient filtering in an integrated circuit device is described. The device comprises three sequential elements, each having a data input and a data output with each of the three data outputs coupled to one of three inputs of a voting gate. The method comprises generating first and second nominally equivalent logic signals in first and second SET domains, converting the first and second nominally equivalent logic signals into first, second and third nominally equivalent data channels, and transmitting the first, second and third nominally equivalent data channels to the data inputs of the first, second and third sequential elements.
Public/Granted literature
- US20100325598A1 SINGLE EVENT TRANSIENT MITIGATION AND MEASUREMENT IN INTEGRATED CIRCUITS Public/Granted day:2010-12-23
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