Invention Grant
US07884636B2 Single event transient mitigation and measurement in integrated circuits 有权
集成电路中的单事件瞬态缓解和测量

Single event transient mitigation and measurement in integrated circuits
Abstract:
A method for single event transient filtering in an integrated circuit device is described. The device comprises three sequential elements, each having a data input and a data output with each of the three data outputs coupled to one of three inputs of a voting gate. The method comprises generating first and second nominally equivalent logic signals in first and second SET domains, converting the first and second nominally equivalent logic signals into first, second and third nominally equivalent data channels, and transmitting the first, second and third nominally equivalent data channels to the data inputs of the first, second and third sequential elements.
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